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  • BS IEC 60748-4-3:2006

    Current The latest, up-to-date edition.

    Semiconductor devices. Integrated circuits Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  28-02-2007

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Characteristics
    5 Measuring methods
      5.1 Dynamic testing with sinusoidal signals
      5.2 Dynamic tests with wideband signals
      5.3 Linearity error of a linear
          ADC (E[L]) (E[L(adj)]) (E[T])
      5.4 Differential linearity error (E[D])
    Annex A (informative) Mathematical derivations
    Annex B (informative) Wideband signal generation
            and analysis
    Bibliography

    Abstract - (Show below) - (Hide below)

    Describes a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics.

    Scope - (Show below) - (Hide below)

    Specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Document Type Standard
    Publisher British Standards Institution
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60268-10:1991 Sound system equipment - Part 10: Peak programme level meters
    IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
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