• BS IEC 61586:1997

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Estimation of the reliability of electrical connectors

    Available format(s):  Hardcopy, PDF

    Superseded date:  28-02-2017

    Language(s):  English

    Published date:  15-08-1997

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 General considerations
        2.1 Intrinsic degradation mechanisms
        2.2 Extrinsic degradation mechanisms
        2.3 Control of extrinsic degradation
        2.4 Failure modes and failure mechanisms
        2.5 Degradation mechanisms
    3 Test methods and acceleration factors
    4 Reliability statistics
    5 Acceptance criteria
    6 Estimation of the reliability of multi-position
        connectors
        6.1 Estimation of connector reliability from contact
              reliability when the contacts in a connector
              perform statistically independently
        6.2 Estimation of connector reliability using
              asymptotic extreme-value distributions
    7 Summary and conclusions
    Annexes
    A Detailed example of an extreme-value reliability
        calculation
    B Bibliography

    Abstract - (Show below) - (Hide below)

    Concerned with the estimating of the reliability of electrical connectors through defining and developing an appropriate accelerated testing programme. Reviews basic intrinsic degradation mechanisms of connectors to give a context for the developing of the desired test programme.

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    Committee EPL/48
    Development Note Supersedes 93/210022 DC. (06/2005) Reviewed and confirmed by BSI, June 2007. (05/2007)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60863:1986 Presentation of reliability, maintainability and availability predictions
    MIL-HDBK-217 Revision F:1991 RELIABILITY PREDICTION OF ELECTRONIC EQUIPMENT
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