BS IEC 61671-4:2016
Current
The latest, up-to-date edition.
Standard for automatic test markup language (ATML) test configuration
Hardcopy , PDF
English
30-04-2016
1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 TestConfiguration schema
5 TestConfiguration instance schema
6 ATML TestConfiguration XML schema names and
locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download web-site
material associated with this document
Annex B (informative) - Test Configuration XML
element mappings to MTPSI card fields
Annex C (informative) - Examples
Annex D (informative) - Bibliography
Annex E (informative) - List of IEEE Participants
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