BS IEC 61671-5:2016
Current
The latest, up-to-date edition.
Standard for automatic test markup language (ATML) test adapter description
Hardcopy , PDF
English
30-04-2016
1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 TestAdapterDescription Schema
5 Schema - TestAdapterInstance.xsd
6 ATML TestAdapterDescription XML schema
names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download website material
associated with this document
Annex B (informative) - Users information and examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography
Annex E (informative) - IEEE List of Participants
Specifies an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description of test adapter instance information.
| Committee |
EPL/501
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
This standard defines an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description of test adapter instance information.
| Standards | Relationship |
| IEC 61671-5:2016 | Identical |
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