BS IEC 62527:2007
Current
The latest, up-to-date edition.
Standard for extensions to standard test interface language (STIL) for DC level specification
31-12-2007
IEEE Introduction
1 Overview
1.1 Scope
1.2 Purpose
2 References
3 Definitions, acronyms and abbreviations
3.1 Definitions
3.2 Acronyms and abbreviations
4 Structure of this standard
5 Extension to Clause 6, STIL syntax description
5.1 Additional reserved words
5.2 DC expressions and units (dc_expr)
5.3 Additions to STIL name spaces and name
resolutions (IEEE Std 1450-1999, 6.16)
6 Statement structure and organization of STIL information
6.1 Top-level statements and required ordering
6.2 Optional top-level statements
7 Extensions to Clause 8, STIL statement
7.1 STIL syntax
7.2 STIL example
8 Extensions to Clause 19, Spec and Selector blocks
9 Extensions to Clause 16, PatternExec block
9.1 PatternExec block syntax
9.2 PatternExec block example
9.3 DCLevels and DCSets usage in PatterExec and
Pattern blocks
10 DCLevels block
10.1 DCLevels block syntax
10.2 DCLevels block example
10.3 Inherit DCLevels Processing
10.4 Inherit DCLevels example
11 DCSets block
11.1 DCSets block syntax
11.2 DCSets statement example
12 DCSequence block
12.1 DCSequence block syntax
12.2 DCSequence example
13 Extensions to Clause 18, WaveformTable block
13.1 Event definition in WaveformTable block
13.2 Mapping of event integers to DCLevels statements
13.3 DC levels switching example
14 Extension to Clause 22, STIL Patten statements
14.1 DCLevles statements
14.2 DCLevles statements example
Annex A (informative) - Dclevels and DCSets usage example
Annex B (informative) - Bibliography
Annex C (informative) - List of participants
Extends IEEE Std 1450-1999 (STIL) to support the definitions of DC levels.
Committee |
EPL/501
|
DocumentType |
Standard
|
PublisherName |
British Standards Institution
|
Status |
Current
|
STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
Standards | Relationship |
IEC 62527:2007 | Identical |
IEEE 1450.2 : 2007 | Identical |
IEEE 1450 : 2007 | STANDARD TEST INTERFACE LANGUAGE (STIL) FOR DIGITAL TEST VECTOR DATA |
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