BS IEC 62860-1:2013
Current
The latest, up-to-date edition.
Test methods for the characterization of organic transistor-based ring oscillators
Hardcopy , PDF
English
31-08-2014
1. Overview
2. Definitions, abbreviations and acronyms
3. Standard ring oscillator characterization
procedures
Annex A (informative) - Bibliography
Annex B (informative) - IEEE List of Participant
Specifies a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
| Committee |
NTI/1
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
| Standards | Relationship |
| IEC 62860-1:2013 | Identical |
| IEEE 1139-2008 | IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities |
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