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BS IEC 62860-1:2013

Current

Current

The latest, up-to-date edition.

Test methods for the characterization of organic transistor-based ring oscillators

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-08-2014

€231.38
Excluding VAT

1. Overview
2. Definitions, abbreviations and acronyms
3. Standard ring oscillator characterization
   procedures
Annex A (informative) - Bibliography
Annex B (informative) - IEEE List of Participant

Specifies a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

Committee
NTI/1
DocumentType
Standard
Pages
26
PublisherName
British Standards Institution
Status
Current

This standard describes a method for characterizing organic electronic transistor-based ring oscillators, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

Standards Relationship
IEC 62860-1:2013 Identical

IEEE 1139-2008 IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities

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