BS IEC 62860:2013
Current
The latest, up-to-date edition.
Test methods for the characterization of organic transistors and materials
Hardcopy , PDF
English
31-08-2014
1. Overview
2. Definitions, acronyms, and abbreviations
3. Standard OFET characterization procedures
Annex A (informative) - Bibliography
Annex B (informative) - IEEE List of Participants
Specifies a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
| Committee |
NTI/1
|
| DocumentType |
Standard
|
| Pages |
28
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
| Standards | Relationship |
| IEC 62860:2013 | Identical |
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