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BS ISO 16413:2013

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

Available format(s)

Hardcopy , PDF

Superseded date

18-08-2020

Language(s)

English

Published date

31-03-2013

Foreword
Introduction
1 Scope
2 Terms, definitions, symbols and abbreviated terms
3 Instrumental requirements, alignment and
  positioning guidelines
4 Data collection and storage
5 Data analysis
6 Information required when reporting XRR analysis
Annex A (informative) - Example of report for an
        oxynitrided silicon wafer
Bibliography

Describes a method for the evaluation of thickness, density and interface width of single layer and multilayered thin films which have thicknesses between approximately 1 nm and 1 [mu]m, on flat substrates, by means of X-Ray Reflectometry (XRR).

Committee
CII/60
DevelopmentNote
Supersedes 12/30235353 DC. (03/2013)
DocumentType
Standard
Pages
42
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
ISO 16413:2013 Identical

ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)
ISO 25178-2:2012 Geometrical product specifications (GPS) Surface texture: Areal Part 2: Terms, definitions and surface texture parameters

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