BS ISO 17470:2014
Current
The latest, up-to-date edition.
Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Hardcopy , PDF
English
31-01-2014
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Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviated terms
5 Apparatus
6 Procedure for identification
7 Test report
Annex A (informative) - Example of the test report
on qualitative analysis of a stainless
steel sample by EPMA
Bibliography
Provides guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume (on a (mu)m[3] scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
| Committee |
CII/9
|
| DevelopmentNote |
Supersedes 03/303319 DC (10/2004)
|
| DocumentType |
Standard
|
| Pages |
22
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This International Standard gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
| Standards | Relationship |
| ISO 17470:2014 | Identical |
| ISO 14594:2014 | Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy |
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