BS ISO 17915:2018
Current
The latest, up-to-date edition.
Optics and photonics. Measurement method of semiconductor lasers for sensing
Hardcopy , PDF
English
31-05-2018
Important note : Users cannot be edited or removed once added to your Multi user PDF.This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.
| Committee |
CPW/172
|
| DocumentType |
Standard
|
| ISBN |
9780580972430
|
| Pages |
38
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.
This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.
| Standards | Relationship |
| ISO 17915:2018 | Identical |
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