BS ISO 20263:2017
Current
The latest, up-to-date edition.
Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
Hardcopy , PDF
English
04-01-2018
Foreword
Introduction
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Specimen preparation for cross-sectional imaging
5 Determination of an interface position
6 Detailed procedure for determining the position of
the interface
7 Uncertainty
Annex A (informative) - Examples of processing the
real TEM/STEM images for three image types
Annex B (informative) - Two main applications for
this method
Annex C (informative) - Calibration of scale unit: Pixel
size calibration
Bibliography
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.