BS ISO 20289:2018
Current
The latest, up-to-date edition.
Surface chemical analysis. Total reflection X-ray fluorescence analysis of water
23-03-2018
Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
5 Safety
6 Interferences
7 Apparatus
8 Reagents, standards and materials
9 Sample preparation
10 Procedure
11 Qualitative and quantitative analysis
12 Quality control
13 Precision and accuracy
14 Test report
Annex A (informative) - Uncertainty in TXRF measurements
Annex B (informative) - Validation of the method
Bibliography
Gives a chemical method for technicians working with Total Reflection X-ray Fluorescence (TXRF) instrumentation to perform measurements of water samples, according to good practices, with a defined degree of accuracy and precision.
Committee |
CII/60
|
DevelopmentNote |
Supersedes 17/30319520 DC. (03/2018)
|
DocumentType |
Standard
|
PublisherName |
British Standards Institution
|
Status |
Current
|
This document provides a chemical method for technicians working with Total Reflection X-ray Fluorescence (TXRF) instrumentation to perform measurements of water samples, according to good practices, with a defined degree of accuracy and precision. Target users are identified among laboratories performing routine analysis of large numbers of samples, which also comply with ISO/IEC17025.
This document specifies a method to determine the content of elements dissolved in water (for example, drinking water, surface water and ground water). Taking into account the specific and additionally occurring interferences, elements can also be determined in waste waters and eluates. Sampling, dilution and pre-concentration methods are not included in this document.
Elements that can be determined with the present method may change according to the X-ray source of the instrument. No health, safety or commercial aspects are considered herewith.
The working range depends on the matrix and the interferences encountered. In drinking water and relatively unpolluted waters, the limit of quantification lies between 0,001mg/l and 0,01mg/l for most of the elements. The working range typically covers concentrations between 0,001mg/l and 10mg/l, depending on the element and predefined requirements.
Annex B reports, for example, the complete validation of the method of TXRF analysis of water performed with instrumentation that has Mo as the X-ray source and uses Ga as the internal standard for calibration.
Quantification limits of most elements are affected by blank contamination and depend predominantly on the laboratory air-handling facilities available, on the purity of reagents and the cleanliness of labware.
Standards | Relationship |
ISO 20289:2018 | Identical |
ISO 5725-1:1994 | Accuracy (trueness and precision) of measurement methods and results — Part 1: General principles and definitions |
ISO 14706:2014 | Surface chemical analysis Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy |
ISO 5667-3:2012 | Water quality Sampling Part 3: Preservation and handling of water samples |
ISO 5667-1:2006 | Water quality Sampling Part 1: Guidance on the design of sampling programmes and sampling techniques |
ISO 5725-2:1994 | Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method |
ISO 3696:1987 | Water for analytical laboratory use — Specification and test methods |
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