Customer Support: +353 (0)1 857 6730

Corporate Website About Us
  • There are no items in your cart
Please enter a keyword to search
Advanced search
Home
BSI
BS ISO 20341:2003

BS ISO 20341:2003

Current

Current

The latest, up-to-date edition.

Surface chemical analysis. Secondary-ion mass spectrometry. Method for estimating depth resolution parameters with multiple delta-layer reference materials

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

08-08-2003

Publisher

British Standards Institution

1 Scope
2 Normative references
3 Symbols
4 Requirements for multiple delta-layer reference materials
5 Procedures
6 Test report
Annex A (normative) Simpler options of estimating SIMS depth
        resolution parameters
Bibliography

Gives procedures for estimating three depth resolution parameters, viz the leading-edge decay length, the trailing-edge decay length and the Gaussian broadening, in SIMS depth profiling using multiple delta-layer reference materials.

Committee
CII/60
DevelopmentNote
Supersedes 02/122923 DC (08/2003) Reviewed and confirmed by BSI, January 2010. (12/2009)
DocumentType
Standard
Pages
14
PublisherName
British Standards Institution
Status
Current
Supersedes

This part of ISO3262 specifies the requirements and the corresponding methods of test for natural quartz (ground).

Standards Relationship
ISO 20341:2003 Identical

ISO 18115:2001 Surface chemical analysis Vocabulary

View more information
€131.12
Excluding VAT
EUR
CAD
CHF
CNY
DKK
EUR
GBP
HKD
IDR
INR
JPY
KRW
MXN
NOK
NZD
SEK
SGD
USD
ZAR
Hardcopy - English
PDF - English
01
02
03
04
05
06
07
08
09
10
11
12
13
14
15
16
17
18
19
20

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.

Get in touch with us