BS ISO 21270:2004
Current
The latest, up-to-date edition.
Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
Hardcopy , PDF
English
31-03-2005
Foreword
Introduction
1 Scope
2 Normative reference
3 Symbols
4 Outline of the methods
5 When to use this International Standard
6 Procedure for evaluating the intensity linearity
6.1 The samples
6.2 Preparing the copper sample
6.3 Preparing the stainless-steel sample or sample
holder
6.4 Choosing the spectrometer settings for which the
intensity linearity measurement is required
6.5 Operating the instrument
6.6 Measurement of the intensity scale linearity by
varying the source flux
6.7 Determination of the intensity scale linearity
by varying the source flux
6.8 Measurement of the intensity scale linearity in
XPS using the spectrum ratio method for systems
with two or more but less than 30 X-ray source
emission current settings
6.9 Determination of the intensity scale linearity in
XPS using the spectrum ratio method for systems
with two or more but less than 30 X-ray source
emission current settings
6.10 Completing the analysis
Annex A (informative) Example results of linearity measurements
using the spectrum ratio method
(the second method)
Bibliography
Defines two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. Also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.
Committee |
CII/60
|
DevelopmentNote |
Supersedes 02/123575 DC. (04/2005) Reviewed and confirmed by BSI, March 2016. (03/2016)
|
DocumentType |
Standard
|
Pages |
22
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
This International Standard specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.
Standards | Relationship |
ISO 21270:2004 | Identical |
ISO 18115:2001 | Surface chemical analysis Vocabulary |
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