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BS ISO 23830:2008

Current

Current

The latest, up-to-date edition.

Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

31-12-2008

€217.36
Excluding VAT

Foreword
Introduction
1 Scope
2 Symbols and abbreviations
3 Outline of method
4 Method for confirming the repeatability and constancy
  of the intensity scale
  4.1 Obtaining the reference sample
  4.2 Preparation for mounting the sample
  4.3 Mounting the sample
  4.4 Choosing the spectrometer settings for which intensity
      stability is to be determined
  4.5 Operating the instrument
  4.6 Measurements of the intensity and its repeatability
  4.7 Calculating the intensity repeatability
  4.8 Procedure for the regular determination of the constancy
      of the relative-intensity scale
  4.9 Next calibration
Annex A (informative) - Example of suitable operating conditions
                        for static SIMS
Bibliography

Describes a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes.

Committee
CII/60
DevelopmentNote
Supersedes 07/30138812 DC. (12/2008)
DocumentType
Standard
Pages
24
PublisherName
British Standards Institution
Status
Current
Supersedes

This International Standard specifies a method for confirming the repeatability and constancy of the positive-ion relative-intensity scale of static secondary-ion mass spectrometers, for general analytical purposes. It is only applicable to instruments that incorporate an electron gun for charge neutralization. It is not intended to be a calibration of the intensity/mass response function. That calibration may be made by the instrument manufacturer or another organization. The present method provides data to confirm the constancy of relative intensities with instrument usage. Guidance is given on some of the instrument settings that may affect this constancy.

Standards Relationship
ISO 23830:2008 Identical

ISO 7873:1993 Control charts for arithmetic average with warning limits
ISO 24236:2005 Surface chemical analysis Auger electron spectroscopy Repeatability and constancy of intensity scale
ISO 7870-1:2014 Control charts Part 1: General guidelines

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