BS ISO 25498:2010
Current
The latest, up-to-date edition.
Microbeam analysis. Analytical electron microscopy. Selected-area electron diffraction analysis using a transmission electron microscope
Hardcopy , PDF
English
30-06-2010
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Principle
5 Reference materials
6 Equipment
7 Specimens
8 Experimental procedure
9 Measurement and solution of the SAED patterns
10 180 Degrees ambiguity
11 Uncertainty estimation
Annex A (informative) - Interplanar spacing
Annex B (informative) - Spot diffraction patterns
of single crystals for BCC, FCC and HCP
structure
Bibliography
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.