BS ISO 9286:1997

1 Scope
2 Normative reference
3 Analysis of surface impurities
    3.1 Sampling
    3.2 Preparation of sample
    3.3 Determination of surface silicon
    3.4 Determination of surface carbon
    3.5 Determination of loss on acid treatment (LAT)
    3.6 Determination of surface silicon dioxide
    3.7 Calculation of the content of residual silicon
          carbide
    3.8 Determination of surface iron
    3.9 Determination of surface iron by atomic
          absorption spectrometry (AAS)
    3.10 Determination of surface aluminium oxide
    3.11 Determination of surface aluminium oxide by
          atomic absorption spectrometry (AAS)
    3.12 Determination of surface calcium oxide and of
          surface magnesium oxide
    3.13 Determination of surface magnesium oxide and of
          surface calcium oxide by atomic absorption
          spectrometry (AAS)
4 Determination of silicon carbide (SiC) in crushed
    silicon carbide
    4.1 Principle
    4.2 Preparation of sample
    4.3 Determination of total carbon
    4.4 Determination of free carbon
    4.5 Calculation of the silicon carbide (SiC) content
5 Test report
Annexes
A Other methods of analysis
B Permissible deviation as a result of variations in the
    measuring technique for the chemical analysis of
    silicon carbide