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BS PD IEC 62240 : 2001

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

USE OF SEMICONDUCTOR DEVICES OUTSIDE MANUFACTURER'S SPECIFIED TEMPERATURE RANGES

Superseded date

31-01-2006

Published date

23-11-2012

INTRODUCTION
1. SCOPE
2. REFERENCES
   2.1 NORMATIVE REFERENCES
   2.2 INFORMATIVE REFERENCES
3. TERMS AND DEFINITION
4. OBJECTIVES
5. USING DEVICES OUTSIDE THE MANUFACTURER'S SPECIFIED
   TEMPERATURE RANGES
   5.1 DEVICE SELECTION, USAGE AND ALTERNATIVES
   5.2 DEVICE CAPABILITY ASSESSMENT
   5.3 DEVICE QUALITY ASSURANCE IN WIDER TEMPERATURE RANGES
   5.4 DOCUMENTATION
   5.5 DEVICE IDENTIFICATION
ANNEX A. DEVICE PARAMETER RE-CHARACTERIZATION
A.1 GLOSSARY OF SYMBOLS
A.2 RATIONALE FOR PARAMETER RE-CHARACTERIZATION
A.3 CAPABILITY ASSURANCE
A.4 QUALITY ASSURANCE
A.5 FACTORS TO BE CONSIDERED IN PARAMETER RE-CHARACTERIZATION
A.6 REFERENCES
ANNEX B - STRESS BALANCING
B.1 INTRODUCTION
B.2 GLOSSARY OF SYMBOLS
B.3 STRESS BALANCING
B.4 APPLICATION EXAMPLE
B.5 OTHER NOTES
ANNEX C: PARAMETER CONFORMANCE ASSESSMENT
C.1 INTRODUCTION
C.2 TEST PLAN
ANNEX D - HIGHER ASSEMBLY LEVEL TESTING
D.1 INTRODUCTION
D.2 PROCESS



It lays down processes for using semiconductor devices in wider temperature ranges than those specified by the device manufacturer. It is applicable to any designer or manufacturer of equipment intended to operate under conditions that require semiconductor devices to function in temperature ranges beyond those for which the devices are marketed.

Committee
GEL/107
DevelopmentNote
Also numbered as IEC/PAS 62240 (06/2001)
DocumentType
Standard
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

Standards Relationship
IEC PAS 62240:2001 Identical

IEC 60134:1961 Rating systems for electronic tubes and valves and analogous semiconductor devices

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