BS QC 390000:1992
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Generic specification
Hardcopy , PDF
29-02-2012
English
15-07-1992
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Committees responsible
National foreword
Specification
Section 1. Scope
1. Scope
Section 2. General
2. General
2.1 Related documents
2.2 Units, symbols and terminology
2.3 Preferred values
2.4 Marking
Section 3. Quality assessment procedures
3. Quality assessment procedures
3.1 Qualification approval/quality assessment systems
3.2 Primary stage of manufacture
3.3 Manufacturing stages in a factory of an approved
manufacturer in a non-IECQ member country and sub-
contracting
3.4 Manufacturer approval
3.5 Approval procedures
3.6 Qualification approval procedures
3.7 Capability approval procedures
3.8 Quality conformance inspection
3.9 Alternative test methods
3.10 Unchecked parameters
Section 4. Test and measurement procedures
4. Test and measurement procedures
4.1 General
4.2 Standard atmosphere conditions
4.3 Drying
4.4 Visual examination and check of dimensions
4.5 Resistance
4.6 Resistance ratio
4.7 Functional characteristics
4.8 Insulation resistance (insulated styles only)
4.9 Voltage proof (insulated networks only)
4.10 Variation of resistance with temperature
4.11 Non-linear properties
4.12 Overload
4.13 Robustness of terminations
4.14 Solderability
4.15 Resistance to soldering heat
4.16 Rapid change of temperature
4.17 Shock
4.18 Vibration
4.19 Climatic sequence
4.20 Damp heat, steady state
4.21 Endurance
4.22 Component solvent resistance
4.23 Solvent resistance of the marking
Appendices
A. Interpretation of sampling plans and procedures as
described in IEC Publication 410 for use within the
IEC Quality Assessment System for Electronic
Components
B. Rules for the preparation of detail specification
for capacitors and resistors for electronic
equipment
Establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications for qualification approval and capability approval of fixed film resistor networks.
| Committee |
W/-
|
| DevelopmentNote |
Also numbered as IEC 61045-1 (08/2005)
|
| DocumentType |
Standard
|
| Pages |
48
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| BS QC 390100:1992 | Harmonized system of quality assessment for electronic components. Fixed film resistor networks for use in electronic equipment. Sectional specification for film resistor networks of assessed quality on the basis of the capability approval procedure |
| BS 5692:1979 | Method for measurement of the dimensions of a cylindrical electronic component having two axial terminations |
| BS 2011-2.1M:1984 | Environmental testing. Tests Test M. Low air pressure |
| BS 3934-1:1992 | Mechanical standardization of semiconductor devices Recommendations for the preparation of drawings of semiconductor devices |
| BS 2011-2.1B:1977 | Environmental testing. Tests Tests B. Dry Heat |
| BS 4119:1967 | Method of measurement of current noise generated in fixed resistors |
| BS 6303:1982 | Method for determination of the space required by capacitors and resistors with unidirectional terminations |
| BS 2011-2.1XA(1981) : 1981 AMD 7553 | ENVIRONMENTAL TESTING - TESTS - TEST XA AND GUIDANCE - IMMERSION IN CLEANING SOLVENTS |
| BS 2488:1966 | Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment |
| IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
| BS 2011-2.1N:1985 | Environmental testing. Tests Test N. Change of temperature |
| BS 2045:1965 | Preferred numbers |
| BS 2011-2.1Ca:1977 | Environmental testing. Tests Test Ca. Damp heat, steady state |
| BS QC 001002:1991 | Rules of procedure of the IEC quality assessment system for electronic components (IECQ) |
| BS 5555:1981 | Specification for SI units and recommendations for the use of their multiples and of certain other units |
| BS QC 763000(1990) : AMD 6754 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. FILM AND HYBRID FILM INTEGRATED CIRCUITS. GENERIC SPECIFICATION |
| BS 5694:1979 | Method for measurement of non-linearity in resistors |
| BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
| BS 2011-2.1T:1981 | Environmental testing. Tests Test T. Soldering |
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