BS QC 400000:1990
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment: generic specification
Hardcopy , PDF
01-04-2007
English
31-08-1990
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National foreword
Committees responsible
Section One - Scope
1. Scope
Section Two - General
2. General
2.1 Related documents
2.2 Units, symbols and terminology
2.3 Preferred values
2.4 Marking
Section Three. Quality assessment procedures
3. Quality assessment procedures
3.1 Qualification Approval/Quality Assessment Systems
3.2 Primary Stage of Manufacture
3.3 Structurally Similar Components
3.4 Qualification Approval Procedures
3.5 Quality Conformance Inspection
3.6 Alternative test methods
3.7 Unchecked parameters
Section Four. Test and measurement procedures
4. Test and measurement procedures
4.1 General
4.2 Standard atmospheric conditions
4.3 Drying
4.4 Visual examination and check of dimensions
4.5 Resistance
4.6 Insulation resistance (insulated styles only)
4.7 Voltage proof
4.8 Variation of resistance with temperature
4.9 Reactance
4.10 Non-linear properties
4.11 Voltage coefficient
4.12 Noise
4.13 Overload
4.14 Temperature rise
4.15 Robustness of the resistor body
4.16 Robustness of terminations
4.17 Solderability
4.18 Resistance to soldering heat
4.19 Rapid change of temperature
4.20 Bump
4.21 Shock
4.22 Vibration
4.23 Climatic sequence
4.24 Damp heat, steady state
4.25 Endurance
4.26 Accidental overload test (for low power non-
wirewound resistors only)
4.27 Single-pulse high-voltage overload test
4.28 Periodic pulse high-voltage overload test
4.29 Component solvent resistance
4.30 Solvent resistance of marking
4.31 Mounting (for chip resistors only)
4.32 Adhesion
4.33 Bond strength of the end face plating
Appendix
A. Interpretation of sampling plans and procedures as
described in IEC Publication 410 for use within
the IEC Quality Assessment System for Electronic
Components
B. Rules for the preparation of detail specifications
for capacitors and resistors for electronic
equipment
C. Example of a test equipment for the periodic pulse
high-voltage overload test
Describes fixed resistors for use in electronic equipment. Establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications for qualification approval and for quality assessment systems for electronic components.
| Committee |
W/-
|
| DevelopmentNote |
Supersedes 85/24369 DC and BS 9940-0(1983). (08/2005)
|
| DocumentType |
Standard
|
| Pages |
52
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Supersedes |
| BS QC 400202:1992 | Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed power resistors. Assessment level F |
| BS QC 400102:1992 | Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed low-power non-wirewound resistors. Assessment level F |
| BS QC 400600:1990 | Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Sectional specification: fixed surface mounting (chip) resistors |
| BS QC 400203:1993 | Specification for fixed resistors for use in electronic equipment. Blank detail specification. Fixed power resistors, heat-sink types. Assessment level H |
| BS QC 400302:1992 | Specification for harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment. Blank detail specification. Fixed precision resistors. Assessment level F |
| BS 5692:1979 | Method for measurement of the dimensions of a cylindrical electronic component having two axial terminations |
| BS 2011-2.1M:1984 | Environmental testing. Tests Test M. Low air pressure |
| BS 2011-2.1B:1977 | Environmental testing. Tests Tests B. Dry Heat |
| BS 4119:1967 | Method of measurement of current noise generated in fixed resistors |
| BS 923-2:1980 | Guide on high-voltage testing techniques Test procedures |
| BS 2488:1966 | Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment |
| IEC 60027-1:1992 | Letters symbols to be used in electrical technology - Part 1: General |
| BS 2011-2.1N:1985 | Environmental testing. Tests Test N. Change of temperature |
| BS 2045:1965 | Preferred numbers |
| BS 2011-2.1Ca:1977 | Environmental testing. Tests Test Ca. Damp heat, steady state |
| BS 4727(1971) : LATEST | |
| BS 9000-3:1987 | General requirements for a system for electronic components of assessed quality Specification for national implementation of IECQ basic rules and rules of procedure |
| BS 5555:1981 | Specification for SI units and recommendations for the use of their multiples and of certain other units |
| BS 5694:1979 | Method for measurement of non-linearity in resistors |
| BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
| BS 2011-2.1T:1981 | Environmental testing. Tests Test T. Soldering |
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