BS QC 750100:1986+A2:1996
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
Hardcopy , PDF
English
31-01-2010
Important note : Users cannot be edited or removed once added to your Multi user PDF.Procedures to be followed with discrete semiconductor devices (excluding optoelectronic devices), the possible group conditions for structurally similar devices, the requirements for quality conformance inspection and the various steps for screening. Also preferred values of voltages and currents, identification of terminals.
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
22
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
This sectional specification applies to discrete semiconductor devices, excluding opto-electronic devices.
| Standards | Relationship |
| IEC 60747-11:1985/AMD2:1996 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.