BS QC 790111:1993
Current
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The latest, up-to-date edition.
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
15-09-1993
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.One of a series of blank detail specifications for semiconductor devices in the IECQ system.
| Committee |
EPL/47
|
| DevelopmentNote |
Also numbered as IEC 60748-2-8 Supersedes 88/20405 DC (08/2005)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
| BS QC790100(1991) : 1991 AMD 10586 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS |
| BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
| BS QC 001002:1991 | Rules of procedure of the IEC quality assessment system for electronic components (IECQ) |
| BS QC700000(1991) : 1991 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS |
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