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  • BS QC010000(1993) : AMD 10432

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. CONNECTORS FOR FREQUENCIES BELOW 3 MHz FOR USE WITH PRINTED BOARDS - GENERIC SPECIFICATION: GENERAL REQUIREMENTS AND GUIDE FOR THE PREPARATION OF DETAIL SPECIFICATIONS, WITH ASSESSED QUALITY

    Available format(s): 

    Superseded date:  15-03-2000

    Language(s): 

    Published date:  23-11-2012

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    Committees responsible
    National foreword
    Specification
    1 Scope and object
    2 Related documents
    3 Quality assessment procedures
    4 Testing
    5 Title of detail specifications
    Annexes
    A Common lettering system to be used in drawings
    B Recommended termination lengths for printed board
         connectors having terminals intended to be flow
         soldered
    Tables
    I Qualification approval test schedule for connectors
    IIa Quality conformance inspection, lot-by-lot tests
    IIb Quality conformance inspection, periodicity tests

    Abstract - (Show below) - (Hide below)

    Establishes uniform specifications, type test requirements and quality assessment procedures for connectors for use with printed boards and to establish rules for the preparation of detail specifications for connectors of assessed quality. Applies to printed board connectors designed for use in equipment for telecommunications and electronic data processing and in electronic equipment or devices using similar devices. Also includes detailed tables. BS AMD 10432 RENUMBERS STANDARD

    General Product Information - (Show below) - (Hide below)

    Committee ECL/21
    Development Note Superseded and renumbered by BS EN 60603-1 (07/2004)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 60297-4:1995 Mechanical structures for electronic equipment. Dimensions of mechanical structures of the 482.6 mm (19 in) series Subracks and associated plug-in units. Additional dimensions

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 60512-6:1984 Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 6: Climatic tests and soldering tests
    IEC 60512-7:1993 Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests
    IEC 60410:1973 Sampling plans and procedures for inspection by attributes
    ISO 286-1:2010 Geometrical product specifications (GPS) ISO code system for tolerances on linear sizes Part 1: Basis of tolerances, deviations and fits
    IEC 60512-4:1976 Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 4: Dynamic stress tests
    ISO 286-2:2010 Geometrical product specifications (GPS) ISO code system for tolerances on linear sizes Part 2: Tables of standard tolerance classes and limit deviations for holes and shafts
    ISO 129:1985 Technical drawings Dimensioning General principles, definitions, methods of execution and special indications
    IEC 60512-5:1992 Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 5: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests
    IEC 60512-1:2001 Connectors for electronic equipment - Tests and measurements - Part 1: General
    IEC 60050-581:2008 International Electrotechnical Vocabulary (IEV) - Part 581: Electromechanical components for electronic equipment
    IEC 60512-3:1976 Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 3: Current-carrying capacity tests
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