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  • CECC 30000 : 83 AMD 8

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    GENERIC SPECIFICATION: FIXED CAPACITORS

    Available format(s): 

    Superseded date:  01-11-1993

    Language(s): 

    Published date:  12-01-2013

    Publisher:  Cenelec Electronic Components Committee

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    Abstract - (Show below) - (Hide below)

    Establishes standard terms, inspection procedures and methods of tests for use in sectional and detail specifications within the CECC System for electronic components. Coverage includes marking, voltage proof, impedance, bump, container sealing, vibration, climatic sequence, endurance, leakage current, drying, storage, surge, shear test, pressure relief, passive flammability, pressure relief, and rapid change of temperature.

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    Development Note Also numbered as I.S. 569. (10/2002)
    Document Type Standard
    Publisher Cenelec Electronic Components Committee
    Status Superseded

    Standards Referenced By This Book - (Show below) - (Hide below)

    DEFSTAN 59-45(PT1)/3(1985) : 1985 FILTERS AND NETWORKS OF ASSESSED QUALITY - PART 1: GENERAL REQUIREMENTS
    BS CECC 31701:1988 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric
    I.S. 577:1992 FIXED METALLIZED POLYCARBONATE FILM DIELECTRIC CAPACITORS FOR DIRECT CURRENT (BLANK DETAIL SPECIFICATION)
    I.S. 1110:1991 FIXED METALLIZED POLYETHYLENE-TEREPHTHALATE FILM DIELECTRIC SURFACE MOUNTING CAPACITORS FOR DIRECT CURRENT (DETAIL SPECIFICATION)
    I.S. 529:1991 FIXED CERAMIC CAPACITORS OF CERAMIC DIELECTRIC, CLASS 1 (SECTIONAL SPECIFICATION)
    I.S. 530:1991 FIXED CAPACITORS OF CERAMIC DIELECTRIC, CLASS 2 (SECTIONAL SPECIFICATION)
    BS CECC 30901:1988 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed polystyrene film dielectric metal foil d.c. capacitors
    BS CECC 30400:1984 Harmonized system of quality assessment for electronic components. Sectional specification: fixed metallized polyethylene-terephthalate film dielectric capacitors for direct current
    BS CECC 30101:1988 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed polyethylene-terephthalate film dielectric metal foil capacitors for direct current
    BS CECC 30100:1986 Harmonized system of quality assessment for electronic components. Sectional specification: fixed polyethylene terephthalate film dielectric metal foil capacitors for direct current
    BS CECC 30900:1986 Harmonized system of quality assessment for electronic components. Sectional specification: fixed polystyrene film dielectric metal foil d.c. capacitors
    BS CECC 31801:1988 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed polypropylene film dielectric metal foil d.c. capacitors
    93/200044 DC : 0 PREN 132600 - SECTIONAL SPECIFICATION - SURFACE MOUNTED MICA CAPACITORS - QUALIFICATION APPROVAL
    93/200045 DC : 0 PREN 132601 - BLANK DETAIL SPECIFICATION - SURFACE MOUNTED MICA CAPACITORS - QUALIFICATION APPROVAL
    I.S. 1117:1991 FIXED POLYETHYLENE-TEREPHTHALATE FILM DIELECTRIC METAL FOIL CAPACITORS FOR DIRECT CURRENT (DETAIL SPECIFICATION)
    BS CECC 30501:1978 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed metallized polycarbonate film dielectric d.c. capacitors
    I.S. 1099:1991 DETAIL SPECIFICATION - FIXED TANTALUM CAPACITORS WITH SOLID ELECTROLYTE, POROUS ANODE (SUB-FAMILY 3)
    CECC 30201-803 : 1989 AMD 2 1991 DETAIL SPECIFICATION - FIXED TANTALUM CAPACITORS WITH SOLID ELECTROLYTE, POROUS ANODE (SUB-FAMILY 3)
    I.S. 580:1991 TANTALUM SURFACE MOUNT CAPACITORS (BLANK DETAIL SPECIFICATION)
    BS CECC 30301:1977 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: aluminium electrolytic capacitors with non-solid electrolyte
    BS CECC 30801:1981 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: tantalum chip capacitors
    BS CECC 31200:1981 Harmonized system of quality assessment for electronic components: sectional specification: fixed capacitors with metallized electrodes and polypropylene dielectric
    BS CECC 30300:1978 Harmonized system of quality assessment for electronic components. Sectional specification: aluminium electrolytic capacitors
    I.S. 1126:1993 FIXED TANTALUM SURFACE MOUNTING CAPACITORS WITH SOLID ELECTROLYTE, POROUS ANODE (DETAILED SPECIFICATION)
    BS CECC 31700:1986 Harmonized system of quality assessment for electronic components. Sectional specification: fixed capacitors for direct current with electrodes of thin metal foils and a polycarbonate film dielectric
    BS CECC 30701:1980 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed ceramic dielectric capacitors, class 2
    I.S. 1098:1991 BLANK DETAIL SPECIFICATION - FIXED MULTILAYER CERAMIC CHIP CAPACITORS
    BS CECC 32100:1992 Harmonized system of quality assessment for electronic components. Sectional specification: fixed multilayer ceramic chip capacitors
    I.S. 1109:1991 FIXED CAPACITORS OF CERAMIC DIELECTRIC, CLASS 2 (BLANK DETAIL SPECIFICATION)
    I.S. 531:1991 TANTALUM SURFACE MOUNTING CAPACITORS (SECTIONAL SPECIFICATION) (REVISION)
    BS CECC 31800:1988 Harmonized system of quality assessment for electronic components. Sectional specification: fixed polypropylene film dielectric metal foil d.c. capacitors
    I.S. 1066:1993 FIXED METALLIZED POLYETHYLENE-TEREPHTHALATE FILM DIELECTRIC CAPACITORS FOR DIRECT CURRENT (DETAILED SPECIFICATION)
    BS CECC 30201:1988 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: fixed tantalum capacitors with solid electrolyte, porous anode (sub-family 3)
    BS CECC 30200:1986 Harmonized system of quality assessment for electronic components. Sectional specification: fixed tantalum capacitors with non-solid or solid electrolyte
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