CEI 56-36 : 2000

Foreword
Introduction
1 Scope
2 Normative references
3 Definitions
4 Procedure
Annex A (informative) - Examples of tools for
         identifying failure mechanisms in
         electronic components
Annex B (informative) - Data analysis
Annex C (informative) - Examples of applications
        of reliability stress screening processes

Gives a guide on reliability stress screening techniques and procedures for electronic components. This standard is meant for the use of component manufacturers as a guideline, and component users as a guideline for negotiating with component manufacturers on stress screening requirements also subcontractors who give stress screening as a service.