CEI 56-39 : 2000
Current
The latest, up-to-date edition.
GOODNESS-OF-FIT TESTS, CONFIDENCE INTERVALS AND LOWER CONFIDENCE LIMITS FOR WEIBULL DISTRIBUTED DATA
Hardcopy , PDF
English
01-01-2000
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Definitions and symbols
4 Requirements
5 Assumptions and conditions
6 Limitations and accuracy
7 Input and output data
8 Procedure
Annexes A - Tables
Annexes B - Example
Annexes C - Technical background and references
Gives numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. In addition, it provides a recommended procedure to obtain lower confidence limits for the 10 % fractiles of the lifetime and for the reliability function.
| Committee |
CT 56
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61649:2008 | Identical |
| ISO 2854:1976 | Statistical interpretation of data — Techniques of estimation and tests relating to means and variances |
| IEC 60300-3-4:2007 | Dependability management - Part 3-4: Application guide - Guide to the specification of dependability requirements |
| IEC 60605-6:2007 | Equipment reliability testing - Part 6: Tests for the validity and estimation of the constant failure rate and constant failure intensity |
| ISO 3534-1:2006 | Statistics — Vocabulary and symbols — Part 1: General statistical terms and terms used in probability |
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