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  • CEI 56-39 : 2000

    Current The latest, up-to-date edition.

    GOODNESS-OF-FIT TESTS, CONFIDENCE INTERVALS AND LOWER CONFIDENCE LIMITS FOR WEIBULL DISTRIBUTED DATA

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2000

    Publisher:  Comitato Elettrotecnico Italiano

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Definitions and symbols
    4 Requirements
    5 Assumptions and conditions
    6 Limitations and accuracy
    7 Input and output data
    8 Procedure
    Annexes A - Tables
    Annexes B - Example
    Annexes C - Technical background and references

    Abstract - (Show below) - (Hide below)

    Gives numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. In addition, it provides a recommended procedure to obtain lower confidence limits for the 10 % fractiles of the lifetime and for the reliability function.

    General Product Information - (Show below) - (Hide below)

    Committee CT 56
    Document Type Standard
    Publisher Comitato Elettrotecnico Italiano
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO 2854:1976 Statistical interpretation of data — Techniques of estimation and tests relating to means and variances
    IEC 60300-3-4:2007 Dependability management - Part 3-4: Application guide - Guide to the specification of dependability requirements
    IEC 60605-6:2007 Equipment reliability testing - Part 6: Tests for the validity and estimation of the constant failure rate and constant failure intensity
    ISO 3534-1:2006 Statistics — Vocabulary and symbols — Part 1: General statistical terms and terms used in probability
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