CEI EN 60749-1 : 2005
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL
Hardcopy , PDF
English - Italian
01-01-2005
Important note : Users cannot be edited or removed once added to your Multi user PDF.
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and letter
symbols
4 Standard atmospheric conditions
5 Electrical measurements
6 Use of electrically defective
devices
Annex A (informative) - Cross-references
index
Annex ZA (normative) - Normative
references to international
publications with their
corresponding European
publications
Defines to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-40. (05/2005) Supersedes CEI EN 60749. (05/2008)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-1:2002 | Identical |
| EN 60749-1:2003 | Identical |
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