CEI EN 60749:2000-10
Withdrawn
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
Semiconductor Devices Methods for Climatic and Mechanical Testing
Amended by
Published date
01-10-2000
Publisher
Withdrawn date
01-03-2006
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This Standard lists a number of test methods applicable to semiconductor devices (discrete devices and integrated circuits) within which a choice can be made.
| Committee |
CT 309
|
| DocumentType |
Standard
|
| ProductNote |
New child AMD 1 2001 is now added New child AMD 2 2004 is now added
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Withdrawn
|
| Standards | Relationship |
| EN 60749:1999 | Identical |
| IEC 60749:1996 | Identical |
Summarise
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