CEI EN 60749-23/A1 : 2012
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods Part 23: High temperature operating life
Amendment of
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2012
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.This variant modifies the CEI EN 60749-23: 2006-01 Standard relating to test methods for the evaluation of the useful life in operation at high temperatures for semiconductor devices.
| DocumentType |
Amendment
|
| ISBN |
978-2-88912-334-6
|
| Pages |
0
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-23:2004/A1:2011 | Identical |
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