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CEI EN 60749-27 / A1:2013
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Semiconductor devices - Methods for climatic and mechanical tests Part 27: Sensitivity tests to electrostatic discharges (ESD) - Machine model
Amendment of
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-10-2013
Publisher
This variant modifies the EN / IEC 60749-27 standard concerning the sensitivity tests to electrostatic discharges (ESD) with the machine model (MM).
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