CEI EN 60749-27 / A1:2013
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Methods for climatic and mechanical tests Part 27: Sensitivity tests to electrostatic discharges (ESD) - Machine model
Amendment of
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-10-2013
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.This variant modifies the EN / IEC 60749-27 standard concerning the sensitivity tests to electrostatic discharges (ESD) with the machine model (MM).
| DocumentType |
Amendment
|
| ISBN |
978-2-83220-341-5
|
| Pages |
0
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 60749-27:2006/A1:2012 | Identical |
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