CEI EN 60749-29 : 2012
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 29: LATCH-UP TEST
Hardcopy , PDF
English
01-01-2012
FOREWORD
1 Scope and object
2 Terms and definitions
3 Classification and levels
4 Apparatus and material
5 Procedure
6 Failure criteria
7 Summary
Annex A (informative) - Examples
of special pins that are
connected to passive
components
Annex B (informative) - Calculation
of operating ambient or
operating case temperature
for a given operating
junction temperature
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