CEI EN 60749-31 : 2004
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 31: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (INTERNALLY INDUCED)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2004
Publisher
EWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure
Describes to the applicable to semiconductor devices (discrete devices and integrated circuits).
Committee |
CT 309
|
DevelopmentNote |
Classificazione CEI 47-34. (01/2005) Supersedes CEI EN 60749. (05/2008)
|
DocumentType |
Standard
|
Pages |
12
|
PublisherName |
Comitato Elettrotecnico Italiano
|
Status |
Current
|
Supersedes |
Standards | Relationship |
IEC 60749-31:2002 | Identical |
EN 60749-31:2003 | Identical |
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