CEI EN 60749-38 : 2010
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 38: SOFT ERROR TEST METHOD FOR SEMICONDUCTOR DEVICES WITH MEMORY
Hardcopy , PDF
English
01-01-2010
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FOREWORD
1 Scope
2 Terms and definitions
3 Test apparatus
4 Procedure
5 Evaluation
6 Summary
Bibliography
Describes a procedure for measuring the soft error susceptibility of semiconductor devices with memory when subjected to energetic particles such as alpha radiation.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 309-6. (07/2010)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-38:2008 | Identical |
| EN 60749-38:2008 | Identical |
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