SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 38: SOFT ERROR TEST METHOD FOR SEMICONDUCTOR DEVICES WITH MEMORY

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2010

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
1 Scope
2 Terms and definitions
3 Test apparatus
4 Procedure
5 Evaluation
6 Summary
Bibliography

Describes a procedure for measuring the soft error susceptibility of semiconductor devices with memory when subjected to energetic particles such as alpha radiation.

Committee	CT 309
DevelopmentNote	Classificazione CEI 309-6. (07/2010)
DocumentType	Standard
Pages	18
PublisherName	Comitato Elettrotecnico Italiano
Status	Current

Standards	Relationship
IEC 60749-38:2008	Identical
EN 60749-38:2008	Identical

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CEI EN 60749-38 : 2010

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 38: SOFT ERROR TEST METHOD FOR SEMICONDUCTOR DEVICES WITH MEMORY

Table of Contents

Abstract

General Product Information

International Equivalents

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