CEI EN 60749-6:2017-10
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods Part 6: Storage at high temperature
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-10-2017
Publisher
€39.69
Excluding VAT
The purpose of this part of IEC 60749 is to test and determine the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied.
| Committee |
CT 309
|
| DocumentType |
Test Method
|
| ISBN |
978-2-8322-4003-8
|
| Pages |
16
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-6:2017 | Identical |
| EN 60749-6:2017 | Identical |
Summarise
€39.69
Excluding VAT
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