CEI EN 60749-9:2017-10
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods Part 9: Permanence of marking
Published date
01-10-2017
Publisher
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The purpose of this part of IEC 60749 is to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process.
| Committee |
CT 309
|
| DocumentType |
Standard
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-9:2017 | Identical |
| EN 60749-9:2017 | Identical |
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