CEI EN 61000-4-29 : 2001
Current
The latest, up-to-date edition.
ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-29: TESTING AND MEASUREMENT TECHNIQUES - VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS ON D.C. INPUT POWER PORTS, IMMUNITY TESTS
Hardcopy , PDF
English - Italian
01-01-2001
INTRODUCTION
1 SCOPE AND OBJECT
2 NORMATIVE REFERENCES
3 DEFINITIONS
4 GENERAL
5 TEST LEVELS
6 TEST GENERATOR
7 TEST SET-UP
8 TEST PROCEDURE
9 EVALUATION OF TEST RESULTS
10 TEST REPORT
ANNEX A (Informative) - EXAMPLE OF TEST GENERATORS
AND TEST SET-UP
ANNEX B (Informative) - INRUSH CURRENT MEASUREMENT
ANNEX ZA (Normative) - Normative references to
international publications with their
corresponding European publications
Describes test methods for immunity to voltage dips, short interruptions and voltage variations at the d.c. input power port of electrical or electronic equipment.
Committee |
CT 210
|
DevelopmentNote |
Classificazione CEI 210-60 (09/2001)
|
DocumentType |
Standard
|
Pages |
24
|
PublisherName |
Comitato Elettrotecnico Italiano
|
Status |
Current
|
Standards | Relationship |
EN 61000-4-29:2000 | Identical |
IEC 61000-4-29:2000 | Identical |
EN 61000-4-11:2004/A1:2017 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-11: TESTING AND MEASUREMENT TECHNIQUES - VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS IMMUNITY TESTS (IEC 61000-4-11:2004/A1:2017) |
IEC 61000-4-11:2004+AMD1:2017 CSV | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests |
EN 61000-4-17:1999/A2:2009 | ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-17: TESTING AND MEASUREMENT TECHNIQUES - RIPPLE ON D.C. INPUT POWER PORT IMMUNITY TEST |
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