CEI EN 61788-16 : 2013
Current
The latest, up-to-date edition.
SUPERCONDUCTIVITY - PART 16: ELECTRONIC CHARACTERISTIC MEASUREMENTS - POWER DEPENDENT SURFACE RESISTANCE OF SUPERCONDUCTORS AT MICROWAVE FREQUENCIES
Hardcopy , PDF
English
01-01-2013
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Apparatus
6 Measurement procedure
7 Uncertainty of the test method
8 Test report
Annex A (informative) - Additional information
relating to Clauses 1 to 7
Annex B (informative) - Uncertainty considerations
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines the standard measurement method of power-dependent surface resistance of superconductors at microwave frequencies by the sapphire resonator method.
| Committee |
CT 90
|
| DevelopmentNote |
Classificazione CEI 90-62. (11/2013)
|
| DocumentType |
Standard
|
| Pages |
38
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61788-16:2013 | Identical |
| EN 61788-16:2013 | Identical |
| IEC 61788-15:2011 | Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies |
| ISO/IEC Guide 99:2007 | International vocabulary of metrology Basic and general concepts and associated terms (VIM) |
| EN 61788-15:2011 | Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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