SUPERCONDUCTIVITY - PART 16: ELECTRONIC CHARACTERISTIC MEASUREMENTS - POWER DEPENDENT SURFACE RESISTANCE OF SUPERCONDUCTORS AT MICROWAVE FREQUENCIES

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Hardcopy , PDF

Language(s)

English

Published date

01-01-2013

Publisher

Comitato Elettrotecnico Italiano

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Apparatus
6 Measurement procedure
7 Uncertainty of the test method
8 Test report
Annex A (informative) - Additional information
        relating to Clauses 1 to 7
Annex B (informative) - Uncertainty considerations
Bibliography
Annex ZA (normative) - Normative references to
        international publications with their
        corresponding European publications

Defines the standard measurement method of power-dependent surface resistance of superconductors at microwave frequencies by the sapphire resonator method.

Committee	CT 90
DevelopmentNote	Classificazione CEI 90-62. (11/2013)
DocumentType	Standard
Pages	38
PublisherName	Comitato Elettrotecnico Italiano
Status	Current

Standards	Relationship
IEC 61788-16:2013	Identical
EN 61788-16:2013	Identical

IEC 61788-15:2011	Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
ISO/IEC Guide 99:2007	International vocabulary of metrology Basic and general concepts and associated terms (VIM)
EN 61788-15:2011	Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
ISO/IEC Guide 98-3:2008	Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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CEI EN 61788-16 : 2013

SUPERCONDUCTIVITY - PART 16: ELECTRONIC CHARACTERISTIC MEASUREMENTS - POWER DEPENDENT SURFACE RESISTANCE OF SUPERCONDUCTORS AT MICROWAVE FREQUENCIES

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