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CEI EN 61788-17 : 2013

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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SUPERCONDUCTIVITY - PART 17: ELECTRONIC CHARACTERISTIC MEASUREMENTS - LOCAL CRITICAL CURRENT DENSITY AND ITS DISTRIBUTION IN LARGE-AREA SUPERCONDUCTING FILMS

Available format(s)

Hardcopy , PDF

Superseded date

16-05-2022

Superseded by

CEI EN IEC 61788-17:2022

Language(s)

English

Published date

01-01-2013

€206.39
Excluding VAT

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Apparatus
6 Measurement procedure
7 Uncertainty of the test method
8 Test report
Annex A (informative) - Additional information
        relating to Clauses 1 to 8
Annex B (informative) - Optional measurement
        systems
Annex C (informative) - Uncertainty considerations
Annex D (informative) - Evaluation of the uncertainty
Bibliography
Annex ZA (normative) - Normative references to
        international publications with their
        corresponding European publications

Defines the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages.

Committee
CT 90
DevelopmentNote
Classificazione CEI 90-63. (11/2013)
DocumentType
Standard
Pages
52
PublisherName
Comitato Elettrotecnico Italiano
Status
Superseded
SupersededBy

Standards Relationship
EN 61788-17:2013 Identical

IEC 61788-3:2006 Superconductivity - Part 3: Critical current measurement - DC critical current of Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors
ISO/IEC Guide 99:2007 International vocabulary of metrology Basic and general concepts and associated terms (VIM)
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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