CEI EN 61788-17 : 2013
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
SUPERCONDUCTIVITY - PART 17: ELECTRONIC CHARACTERISTIC MEASUREMENTS - LOCAL CRITICAL CURRENT DENSITY AND ITS DISTRIBUTION IN LARGE-AREA SUPERCONDUCTING FILMS
Hardcopy , PDF
16-05-2022
English
01-01-2013
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Apparatus
6 Measurement procedure
7 Uncertainty of the test method
8 Test report
Annex A (informative) - Additional information
relating to Clauses 1 to 8
Annex B (informative) - Optional measurement
systems
Annex C (informative) - Uncertainty considerations
Annex D (informative) - Evaluation of the uncertainty
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Defines the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages.
Committee |
CT 90
|
DevelopmentNote |
Classificazione CEI 90-63. (11/2013)
|
DocumentType |
Standard
|
Pages |
52
|
PublisherName |
Comitato Elettrotecnico Italiano
|
Status |
Superseded
|
SupersededBy |
Standards | Relationship |
EN 61788-17:2013 | Identical |
IEC 61788-3:2006 | Superconductivity - Part 3: Critical current measurement - DC critical current of Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors |
ISO/IEC Guide 99:2007 | International vocabulary of metrology Basic and general concepts and associated terms (VIM) |
ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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