• CEI EN 61788-17 : 2013

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    SUPERCONDUCTIVITY - PART 17: ELECTRONIC CHARACTERISTIC MEASUREMENTS - LOCAL CRITICAL CURRENT DENSITY AND ITS DISTRIBUTION IN LARGE-AREA SUPERCONDUCTING FILMS

    Available format(s):  Hardcopy, PDF

    Superseded date:  16-05-2022

    Language(s):  English

    Published date:  01-01-2013

    Publisher:  Comitato Elettrotecnico Italiano

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Requirements
    5 Apparatus
    6 Measurement procedure
    7 Uncertainty of the test method
    8 Test report
    Annex A (informative) - Additional information
            relating to Clauses 1 to 8
    Annex B (informative) - Optional measurement
            systems
    Annex C (informative) - Uncertainty considerations
    Annex D (informative) - Evaluation of the uncertainty
    Bibliography
    Annex ZA (normative) - Normative references to
            international publications with their
            corresponding European publications

    Abstract - (Show below) - (Hide below)

    Defines the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages.

    General Product Information - (Show below) - (Hide below)

    Committee CT 90
    Development Note Classificazione CEI 90-63. (11/2013)
    Document Type Standard
    Publisher Comitato Elettrotecnico Italiano
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61788-3:2006 Superconductivity - Part 3: Critical current measurement - DC critical current of Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors
    ISO/IEC Guide 99:2007 International vocabulary of metrology Basic and general concepts and associated terms (VIM)
    ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)
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