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CEI EN 62047-12 : 2012

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MICROELECTROMECHANICAL DEVICES - PART 12: BENDING FATIGUE TESTING METHOD OF THIN FILM MATERIALS USING RESONANT VIBRATION OF MEMS STRUCTURES

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2012

€144.21
Excluding VAT

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test equipment
5 Specimen
6 Test conditions
7 Initial measurement
8 Test
9 Test report
Annex A (informative) - Example of testing using an
        electrostatic device with an integrated actuation
        component and displacement detection component
Annex B (informative) - Example of testing using an
        external drive and a device with an integrated
        strain gauge for detecting displacement
Annex C (informative) - Example of electromagnetic
        drive out-of-plane vibration test (external drive
        vibration test)
Annex D (informative) - Theoretical expression on
        fatigue life of brittle materials based on Paris
        law and Weibull distribution
Annex E (informative) - Analysis examples
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Describes the method for bending fatigue testing using resonant vibration of microscale mechanical structures of MEMS (micro-electromechanical systems) and micromachines.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-103. (12/2012)
DocumentType
Standard
Pages
36
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
EN 62047-12 : 2011 Identical
IEC 62047-12:2011 Identical

IEC 62047-2:2006 Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials
IEC 62047-3:2006 Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing
EN 62047-3 : 2006 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 3: THIN FILM STANDARD TEST PIECE FOR TENSILE TESTING
ISO 12107:2012 Metallic materials — Fatigue testing — Statistical planning and analysis of data

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