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  • CEI EN 62276 : 2013

    Current The latest, up-to-date edition.

    SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2013

    Publisher:  Comitato Elettrotecnico Italiano

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Requirements
    5 Sampling plan
    6 Test methods
    7 Identification, labelling, packaging, delivery condition
    8 Measurement of Curie temperature
    9 Measurement of lattice constant (Bond method)
    10 Measurement of face angle by X-ray
    11 Measurement of bulk resistivity
    12 Visual inspections - Front surface inspection method
    Annex A (normative) - Expression using Euler angle
            description for piezoelectric single crystals
    Annex B (informative) - Manufacturing process
            for SAW wafers
    Bibliography
    Annex ZA (normative) - Normative references to
             international publications with their
             corresponding European publications

    Abstract - (Show below) - (Hide below)

    Pertains to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.

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    Committee CT 309
    Development Note Classificazione CEI 309-40. (12/2013) 2ED 2013 Edition is valid until 28-11-2019. (06/2017)
    Document Type Standard
    Publisher Comitato Elettrotecnico Italiano
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
    EN 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
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