CEI EN 62276 : 2013
Current
The latest, up-to-date edition.
SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS
Hardcopy , PDF
English
01-01-2013
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Sampling plan
6 Test methods
7 Identification, labelling, packaging, delivery condition
8 Measurement of Curie temperature
9 Measurement of lattice constant (Bond method)
10 Measurement of face angle by X-ray
11 Measurement of bulk resistivity
12 Visual inspections - Front surface inspection method
Annex A (normative) - Expression using Euler angle
description for piezoelectric single crystals
Annex B (informative) - Manufacturing process
for SAW wafers
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
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