CEI EN 62373 : 2007
Current
The latest, up-to-date edition.
BIAS-TEMPERATURE STABILITY TEST FOR METAL-OXIDE, SEMICONDUCTOR, FIELD-EFFECT TRANSISTORS (MOSFET)
Hardcopy , PDF
English
01-01-2007
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FOREWORD
INTRODUCTION
1 Scope
2 Terms and definitions
3 Test equipment
4 Test sample
5 Procedure
Annex A (informative) - Wafer level reliability test (WLR test)
Bibliography
Describes a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-1033. (09/2015)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 62373 : 2006 | Identical |
| IEC 62373:2006 | Identical |
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