CEI EN 62415 : 2011
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - CONSTANT CURRENT ELECTROMIGRATION TEST
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2011
Publisher
FOREWORD
1 Scope
2 Symbols, terms and definitions
3 Background
4 Sample size
5 Test structures
6 Test conditions
7 Failure criteria
8 Data analysis
Bibliography
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