CEI EN 62416 : 2011
Current
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - HOT CARRIER TEST ON MOS TRANSISTORS
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2011
Publisher
€39.69
Excluding VAT
FOREWORD
1 Scope
2 Abbreviations and letter symbols
3 Test structures
4 Stress time
5 Stress conditions
6 Sample size
7 Temperature
8 Failure criteria
9 Lifetime estimation method
10 Lifetime requirements
11 Reporting
Bibliography
Specifies the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 309-28. (07/2011)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 62416:2010 | Identical |
| IEC 62416:2010 | Identical |
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