CEI EN 62979 : 1ED 2018
Current
The latest, up-to-date edition.
PHOTOVOLTAIC MODULE - BYPASS DIODE - THERMAL RUNAWAY TEST
Hardcopy , PDF
English
13-05-2018
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Thermal runaway test
6 Test report
Annex ZA (normative) - Normative references
to international publications
with their corresponding
European publications
This document provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating.
| Committee |
CT 82
|
| DevelopmentNote |
Classificazione CEI 82-77. (05/2018)
|
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN 62979:2017 | Identical |
| IEC TS 61836:2007 | Solar photovoltaic energy systems - Terms, definitions and symbols |
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