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CEI EN IEC 60749-13 : 2018

Current

Current

The latest, up-to-date edition.

Semiconductor devices - Mechanical and climatic test methods Part 13: Salt atmosphere

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

26-03-2019

€47.63
Excluding VAT

This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion.

Committee
CT 309
DocumentType
Standard
ISBN
978-2-8322-5369-4
Pages
0
ProductNote
THIS STANDARD IS ALSO REFERES TO :MIL-STD-883J
PublisherName
Comitato Elettrotecnico Italiano
Status
Current

Standards Relationship
IEC 60749-13:2018 Identical
EN IEC 60749-13:2018 Identical

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