CEI EN IEC 60749-13 : 2018
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods Part 13: Salt atmosphere
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
26-03-2019
Publisher
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion.
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